Using Advanced SMUs for Complex Electronics Device Characterization
Discover how SIGLENT’s latest SMUs combine high-power DC, pulsed sourcing, and precision measurement for complete device characterization.
Webinar Overview
Electronic device characterization requirements continue to grow in both complexity and diversity. Source Measure Units offer four-quadrant testing with high-power, pulsed, low-current, and low-voltage capabilities—making them ideal for today’s semiconductors and active components.
In this webinar, we’ll explore the applications and devices that require these advanced test capabilities and show how to tackle them using Siglent’s new SMM3000X series SMUs. We’ll also demonstrate how to combine SMU characterization with Siglent oscilloscopes for dynamic pulse analysis.
By bringing together high-power DC and pulse sourcing with precise low-current and low-voltage measurement, Siglent SMUs enable a complete characterization solution for complex devices. From solar cells and batteries to transistors and superconductors, join us to see advanced characterization techniques and powerful data visualization using the latest Siglent instruments.
