I'm having trouble with a hard drive that is (supposed to be) a part of a RAID5. Here's is the smart log:
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-107-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: HUH721212ALE601
Serial Number: 8DHHX2AH
LU WWN Device Id: 5 000cca 253d55276
Firmware Version: LEGL0002
User Capacity: 12,000,138,625,024 bytes [12.0 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Jun 2 09:58:42 2024 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 87) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 132 132 054 Pre-fail Offline - 96
3 Spin_Up_Time 0x0007 253 253 024 Pre-fail Always - 78 (Average 35)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 92
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 140 140 020 Pre-fail Offline - 15
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 13784
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 18
22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100
45 Unknown_Attribute 0x0023 100 100 001 Pre-fail Always - 1095233372415
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 277
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 277
194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 15/57)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 177 177 000 Old_age Always - 35
231 Temperature_Celsius 0x0032 100 100 000 Old_age Always - 0
241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 1249778606260
242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 1530512354490
SMART Error Log Version: 1
ATA Error Count: 35 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 35 occurred at disk power-on lifetime: 13784 hours (574 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 01 68 08 00 00 40 08 00:16:02.030 WRITE FPDMA QUEUED
2f 00 01 30 06 00 a0 08 00:16:02.028 READ LOG EXT
2f 00 01 30 00 00 a0 08 00:16:02.027 READ LOG EXT
2f 00 01 00 00 00 a0 08 00:16:02.027 READ LOG EXT
2f 00 01 30 08 00 a0 08 00:16:02.026 READ LOG EXT
Error 34 occurred at disk power-on lifetime: 13784 hours (574 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 01 20 08 00 00 40 08 00:16:01.440 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 08 00:16:01.440 FLUSH CACHE EXT
60 08 00 08 00 00 40 08 00:16:01.427 READ FPDMA QUEUED
60 01 f8 10 00 00 40 08 00:16:01.427 READ FPDMA QUEUED
60 08 b8 08 00 00 40 08 00:16:01.427 READ FPDMA QUEUED
[...]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 13784 -
# 2 Short offline Completed without error 00% 13386 -
# 3 Vendor (0x70) Completed without error 00% 13326 -
# 4 Vendor (0x71) Completed without error 00% 13325 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
As you can see several smart tests run througgh fine. However when i try to re-add the drive to my array, the drive keeps changing to a different device letter.
From the dmesg output, it looks like there is a communication issue as it seems to dial down the interfact speed (dmesg output below).
Is this a cable issue, is the controller at fault, or is really the drive defective? I have four of the drives in place, and this is the only one to cause issues - but I don't have a spare SATA port to test the drive at another port.
The fill dmesg is available here
