atomic force microscope


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Related to atomic force microscope: scanning electron microscope

atomic force microscope

n.
A microscope, capable of a magnification factor of 5 × 106 and a resolution of 2 angstroms, that provides a map of the atoms on the surface of an object by measuring the attractive and repulsive forces arising between a tiny probe drawn along the surface and the atoms on that surface. Also called scanning force microscope.
American Heritage® Dictionary of the English Language, Fifth Edition. Copyright © 2016 by Houghton Mifflin Harcourt Publishing Company. Published by Houghton Mifflin Harcourt Publishing Company. All rights reserved.
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Using an atomic force microscope, researchers at Ohio State University measured bumps on the surface of a nanomotor by dragging a tiny needle over it.
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Among such equipment, mention can be made of scanning tunneling microscope (STM), atomic force microscope (AFM), BET, deep reactive ion etching (DRIE), HiReSPECT and capillary electrophoresis instrument.
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The NTegra Spectra incorporates five different kinds of microscopic analysis for samples on the SPM stage: optical, Raman fluorescence, confocal, near-field scanning optical microscope and atomic force microscope (AFM) (see IBO 3/15/06).
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The system employs the mechanism of the atomic force microscope (AFM) and uses a microfabricated cantilever as a cutting tool.
National Institute of Advanced Industrial Science and Technology, Toyama University Develop Nano-machine Processing System That Works Inside Scanning Electron Microscope

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