{"id":"https://openalex.org/W2332614534","doi":"https://doi.org/10.1109/tim.2016.2534278","title":"A Multichannel Array-Driven Scanner With Low Thermal EMF","display_name":"A Multichannel Array-Driven Scanner With Low Thermal EMF","publication_year":2016,"publication_date":"2016-03-11","ids":{"openalex":"https://openalex.org/W2332614534","doi":"https://doi.org/10.1109/tim.2016.2534278","mag":"2332614534"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2016.2534278","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2534278","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079920429","display_name":"Lushuai Qian","orcid":"https://orcid.org/0000-0001-5573-9847"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lushuai Qian","raw_affiliation_strings":["College of Mechatronics Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronics Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109409364","display_name":"Yaqiong Fu","orcid":null},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaqiong Fu","raw_affiliation_strings":["College of Mechatronics Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronics Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009830492","display_name":"Zhengkun Li","orcid":"https://orcid.org/0000-0002-3106-7801"},"institutions":[{"id":"https://openalex.org/I2802303500","display_name":"General Administration of Quality Supervision, Inspection and Quarantine","ror":"https://ror.org/000kjm556","country_code":"CN","type":"government","lineage":["https://openalex.org/I2802303500","https://openalex.org/I4210127390"]},{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengkun Li","raw_affiliation_strings":["Key Laboratory for the Electrical Quantum Standard, General Administration of Quality Supervision, Inspection and Quarantine, Beijing, China","National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory for the Electrical Quantum Standard, General Administration of Quality Supervision, Inspection and Quarantine, Beijing, China","institution_ids":["https://openalex.org/I2802303500"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031674774","display_name":"Cunkai Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cunkai Zhang","raw_affiliation_strings":["College of Mechatronics Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronics Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100420742","display_name":"Le Chen","orcid":"https://orcid.org/0000-0001-6019-0190"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Le Chen","raw_affiliation_strings":["College of Mechatronics Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronics Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3564,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.62958681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"65","issue":"6","first_page":"1456","last_page":"1462"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.8822060823440552},{"id":"https://openalex.org/keywords/electromotive-force","display_name":"Electromotive force","score":0.680591344833374},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.48509275913238525},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.480047345161438},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46462780237197876},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4381197690963745},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4127543568611145},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39766016602516174},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3708593249320984},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3663647770881653},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3000068664550781},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.21666038036346436},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.17195773124694824},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09593045711517334}],"concepts":[{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.8822060823440552},{"id":"https://openalex.org/C127535462","wikidata":"https://www.wikidata.org/wiki/Q185329","display_name":"Electromotive force","level":2,"score":0.680591344833374},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.48509275913238525},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.480047345161438},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46462780237197876},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4381197690963745},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4127543568611145},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39766016602516174},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3708593249320984},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3663647770881653},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3000068664550781},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.21666038036346436},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.17195773124694824},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09593045711517334},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2016.2534278","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2016.2534278","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4935463523","display_name":null,"funder_award_id":"2011YQ-090004","funder_id":"https://openalex.org/F4320335765","funder_display_name":"National Key Scientific Instrument and Equipment Development Projects of China"}],"funders":[{"id":"https://openalex.org/F4320335765","display_name":"National Key Scientific Instrument and Equipment Development Projects of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1635082903","https://openalex.org/W1979286412","https://openalex.org/W2045525960","https://openalex.org/W2055256608","https://openalex.org/W2081020815","https://openalex.org/W2112455288","https://openalex.org/W2115058696","https://openalex.org/W2116044800","https://openalex.org/W2116079410","https://openalex.org/W2119180030","https://openalex.org/W2127178462","https://openalex.org/W2141249859","https://openalex.org/W2152489974","https://openalex.org/W2154135133","https://openalex.org/W4233735806","https://openalex.org/W4243206402","https://openalex.org/W6682923957"],"related_works":["https://openalex.org/W2486764503","https://openalex.org/W2058798703","https://openalex.org/W614692083","https://openalex.org/W2071850169","https://openalex.org/W2363425246","https://openalex.org/W2348546017","https://openalex.org/W2065181154","https://openalex.org/W2021495886","https://openalex.org/W4296050958","https://openalex.org/W2365629550"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3],"multichannel":[4],"array-driven":[5],"scanner":[6,31,109],"with":[7,85],"low":[8],"thermal":[9,27,70],"electromotive":[10],"force":[11],"(EMF)":[12],"is":[13,42,110],"proposed":[14,43],"for":[15],"precision":[16],"electrical":[17],"measurement.":[18],"Three":[19],"novel":[20],"approaches":[21],"are":[22,76],"adopted":[23],"to":[24,44,82,93,125],"decrease":[25],"the":[26,30,46,50,56,61,69,74,78,86,100,104,108,119],"EMF":[28],"of":[29,49,72,103,107],"and":[32,39,59],"improve":[33,60],"its":[34],"stability.":[35],"An":[36],"array-type":[37],"control":[38,48,57,62],"detection":[40],"system":[41],"realize":[45],"closed-loop":[47],"relays,":[51],"which":[52],"can":[53],"effectively":[54],"simplify":[55],"circuit":[58],"efficiency.":[63],"The":[64],"experimental":[65],"results":[66],"show":[67],"that":[68,99],"EMFs":[71],"all":[73],"channels":[75],"in":[77,118],"range":[79],"from":[80,91,122],"-11":[81],"17":[83],"nV":[84],"Type":[87],"A":[88],"uncertainties":[89],"varying":[90],"1":[92],"2":[94],"nV.":[95],"Further":[96],"experiments":[97],"indicate":[98],"Allan":[101],"deviation":[102],"shorted":[105],"channel":[106],"less":[111],"than":[112],"10":[113,123],"<sup":[114],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[115],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-9</sup>":[116],"V":[117],"sampling":[120],"time":[121],"s":[124],"36":[126],"h.":[127]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}